• Semiconductor and solid state physics
  • Investigation of electronic and optical properties of semiconductor structures by:
    • Scanning electron microscopy (SEM)
    • Energy dispersive X-ray spectroscopy (SEM-EDX)
    • Highly spatially resolved cathodoluminescence (SEM-CL)
    • Electron beam induced current (SEM-EBIC)
    • Preparation by focused ion beam (SEM/FIB)
    • Photoluminescence spectroscopy (PL)
    • Secondary ion mass spectroscopy (SIMS)
  • Investigation of crystal structure by:
    • Electron back scattered deflection (SEM-EBSD)
    • X-ray diffractometry (XRD)
    • Transmission electron microscopy (TEM, TEM-EDX)
    • Energy filtered transmission electron microscopy (EFTEM)
    • Transmission electron energy loss spectroscopy (TEM-EELS)
  • Identification of crystal defects
  • Modelling of optical and electronic properties of defects
  • Mechanic modelling of structured samples (finite elements)
  • Efficiency investigations of LED structures
  • Optimization of LED structures and substrates
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